The 2460 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 7A DC and pulse current capability, the 2460 is optimized for characterizing and testing high power materials, devices, and modules such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, power MOSFETs, solar cells and panels, LEDs and lighting systems, electrochemical cells and batteries, and much more. These new capabilities, combined with Keithley’s decades of expertise in developing high precision, high accuracy SMU instruments, will make the 2460 a “go-to instrument” for high current applications in the lab and in the rack for years to come.
When a 2460 is configured into a multi-channel I-V test system, its embedded Test Script Processor (TSP®) allows it to run test scripts, so users can create powerful measurement applications with significantly reduced development times. TSP technology also offers channel expansion without a mainframe. Keithley’s TSP-Link® channel expansion bus, which uses a 100 Base T Ethernet cable, can connect multiple 2460s and other TSP instruments such as Keithley’s 2450 SourceMeter SMU Instruments, Series 2600B System SourceMeter SMU instruments, and Series 3700A Switch/Multimeter systems in a master-slave configuration that operates as one integrated system. The TSP-Link expansion bus supports up to 32 units per GPIB or IP address, making it easy to scale a system to fit an application’s particular requirements. The 2460 also includes a SCPI programming mode that takes advantage of all of the instrument’s capabilities.
Curve tracing analysis is a critical task for many users in the semiconductor development supply chain. Engineers and technicians both hold the traditional curve tracer as the simplest, fastest method for generating characteristic I-V curves on a device. They are heavily used by engineers in failure analysis and incoming inspection to qualify parts, identify counterfeit devices, and to quickly identify the location of a failure on damaged devices. SMUs have typically been limited to predefined sweeps with longer set up times than curve tracers — until I-V Tracer. Keithley’s I-V Tracer app leverages the touchscreen and front-panel knob of the 2460 to allow precise, live control over the SMU output while viewing I-V results of 2 terminal devices. At each individual output level current and voltage are measured and plotted. The small footprint of the SMU enables portable bench top use, reserving high power (kW) traditional curve tracers for special cases. The power envelope of the 2460 allows it to comfortably operate in the low power range of traditional curve tracers like the Tektronix 576 and Tektronix 370A, while offering enhanced low current measurements.
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